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0LM200-1009

The OLM200-1009 represents SICK's next-generation optical length measurement technology, delivering unparalleled precision for the most demanding industrial applications. This ultra-high-performance system combines advanced photonics with intelligent signal processing to achieve sub-micron measurement accuracy in challenging production environments.

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TEL:400-887-3214
Mail:jilineasyyi@outlook.com
Q Q:615739355
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Breakthrough Performance
Precision Measurement Capabilities
Extended dynamic range: 0.1mm to 250m

Industry-leading accuracy: ±0.1mm/m

Ultra-fine resolution: 0.001mm (1μm)

Hyper-speed measurement: Up to 60m/s

Real-time sampling: 50kHz refresh rate

Advanced Technical Specifications
Feature Specification
Optical System Multi-spectral hybrid laser/LED array
Detection Method Phase-shift interferometry + triangulation
Data Interfaces 10G Ethernet, PROFINET IRT, EtherCAT G
I/O System 16 configurable high-speed I/O channels
Power System 24V DC with PoE++ (IEEE 802.3bt)
Environmental Rating IP69K + NEMA 6P
Mechanical Design Titanium-reinforced composite housing
Operating Range -40°C to +85°C
Industry 4.0 Ready
Embedded edge computing with AI accelerator

Digital twin integration via OPC UA

Cybersecurity (IEC 62443 compliant)

Predictive analytics with ML algorithms

Wireless firmware updates

Application Excellence
✔ Nanotechnology material production
✔ Semiconductor ribbon processing
✔ Aerospace-grade composite fabrication
✔ Medical device manufacturing
✔ High-speed packaging 4.0 systems